Temporal Development Of Relative Ablation Of Plastics In Miniature Circuit Breaker During Switching Process

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but.event.date23.04.2020cs
but.event.titleStudent EEICT 2020cs
dc.contributor.authorSimek, David
dc.date.accessioned2021-07-15T11:17:22Z
dc.date.available2021-07-15T11:17:22Z
dc.date.issued2020cs
dc.description.abstractThe paper is focused on an ablation of plastic materials in contact with an electric arc inside the electrical apparatus during the switching process. It is possible to obtain temporal development using method based on optical emission spectroscopy. The emission spectra were taken during the switching process. The hydrogen alpha spectral line of Balmer series was used as an indicator for evaluating of plastics ablation. Complications connected with the measurements are discussed. The main part of the paper deals with a temporal development of relative concentration of a hydrogen in plasma inside the miniature circuit breaker. Atomic spectral lines database of National Institute of Standards and Technology was used as a spectral data source for evaluation.en
dc.formattextcs
dc.format.extent398-402cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings I of the 26st Conference STUDENT EEICT 2020: General papers. s. 398-402. ISBN 978-80-214-5867-3cs
dc.identifier.isbn978-80-214-5867-3
dc.identifier.urihttp://hdl.handle.net/11012/200604
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings I of the 26st Conference STUDENT EEICT 2020: General papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/EEICT2020cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectoptical emission spectroscopyen
dc.subjectplasmaen
dc.subjectminiature circuit breakeren
dc.subjectelectric arcen
dc.titleTemporal Development Of Relative Ablation Of Plastics In Miniature Circuit Breaker During Switching Processen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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