Ag polycrystal and monocrystal by high sensitivity-low energy ion scattering

dc.contributor.authorStaněk, Jancs
dc.contributor.authorPrůša, Stanislavcs
dc.contributor.authorStrapko, Tomášcs
dc.contributor.authorŠikola, Tomášcs
dc.coverage.issue2cs
dc.coverage.volume31cs
dc.date.issued2024-12-30cs
dc.description.abstractLow energy ion scattering is a qualitative and quantitative surface analysis technique. Its supreme surface sensitivity and straightforward quantification (using a well-defined reference) make it a convenient tool for the study of surface composition and a useful method for surface characterization in cooperation with other surface analysis methods such as XPS and SIMS. Silver (100) monocrystal was analyzed by the primary beam of helium ions. The wide energy range from 1.0 to 4.5 keV covers three distinguished regions. On the low energy side, the charge exchange processes are dominated by Auger neutralization (AN), while collision-induced (CI) processes rule a high energy range. Both mechanisms are mixed in the intermediate region between 1.2 and 2.1 keV (for perpendicular incidence and 145 degrees scattering geometry). The results can serve both as a reference and as an insight into neutralization probability changes (as dependence on primary energy). The neutralization strength is reflected by the characteristic velocity. It was evaluated for AN and CI regions to 0.75 x 105 and 0.38 x 105 ms-1, respectively. The CI reionization energy threshold is around 1700 eV for both Ag (100) and polycrystalline Ag. The reference measurement on polycrystalline copper relates the presented data to those received by other Qtac100 instruments with different sensitivities.en
dc.description.abstractLow energy ion scattering is a qualitative and quantitative surface analysis technique. Its supreme surface sensitivity and straightforward quantification (using a well-defined reference) make it a convenient tool for the study of surface composition and a useful method for surface characterization in cooperation with other surface analysis methods such as XPS and SIMS. Silver (100) monocrystal was analyzed by the primary beam of helium ions. The wide energy range from 1.0 to 4.5 keV covers three distinguished regions. On the low energy side, the charge exchange processes are dominated by Auger neutralization (AN), while collision-induced (CI) processes rule a high energy range. Both mechanisms are mixed in the intermediate region between 1.2 and 2.1 keV (for perpendicular incidence and 145 degrees scattering geometry). The results can serve both as a reference and as an insight into neutralization probability changes (as dependence on primary energy). The neutralization strength is reflected by the characteristic velocity. It was evaluated for AN and CI regions to 0.75 x 105 and 0.38 x 105 ms-1, respectively. The CI reionization energy threshold is around 1700 eV for both Ag (100) and polycrystalline Ag. The reference measurement on polycrystalline copper relates the presented data to those received by other Qtac100 instruments with different sensitivities.en
dc.formattextcs
dc.format.extent14cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationSurface Science Spectra. 2024, vol. 31, issue 2, 14 p.en
dc.identifier.doi10.1116/6.0003869cs
dc.identifier.issn1055-5269cs
dc.identifier.orcid0000-0003-1856-4317cs
dc.identifier.orcid0000-0002-0338-3954cs
dc.identifier.orcid0000-0002-8008-0236cs
dc.identifier.orcid0000-0003-4217-2276cs
dc.identifier.other193998cs
dc.identifier.researcheridH-4920-2016cs
dc.identifier.urihttp://hdl.handle.net/11012/251581
dc.language.isoencs
dc.publisherAIP Publishingcs
dc.relation.ispartofSurface Science Spectracs
dc.relation.urihttps://pubs.aip.org/avs/sss/article/31/2/024201/3328702/Ag-polycrystal-and-monocrystal-by-high-sensitivitycs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1055-5269/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectEXCHANGEen
dc.subjectBLOCKINGen
dc.subjectATOMSen
dc.subjectLEISen
dc.subjectHE+en
dc.subjectEXCHANGE
dc.subjectBLOCKING
dc.subjectATOMS
dc.subjectLEIS
dc.subjectHE+
dc.titleAg polycrystal and monocrystal by high sensitivity-low energy ion scatteringen
dc.title.alternativeAg polycrystal and monocrystal by high sensitivity-low energy ion scatteringen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-193998en
sync.item.dbtypeVAVen
sync.item.insts2025.10.14 15:06:20en
sync.item.modts2025.10.14 10:41:34en
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav fyzikálního inženýrstvícs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Příprava a charakterizace nanostrukturcs

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
024201_1_6.0003869.pdf
Size:
1.55 MB
Format:
Adobe Portable Document Format
Description:
file 024201_1_6.0003869.pdf