Comprehensive Analysis of E478 Single-Component Epoxy Resin and Tungsten-E478 Interface for Metallic-Polymer Composite Electron Source Applications
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Allaham, Mohammad Mahmoud Mohammad
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American Chemical Society
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Abstract
This study provides comprehensive elemental, optical, and energy gap characteristics of the E478 single-component epoxy resin. This type of epoxy resin has imperative applications in medium voltage insulation and cold field emission of electrons. X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and hydrogen nuclear magnetic resonance (1H-NMR) were used to study the elemental and structural analyses, ultraviolet photoelectron spectroscopy (UPS) was used to obtain the local work function and the ionization potential energies, and ultraviolet/visible light spectroscopy (UV/VIS) was used to report the optical and energy gap characteristics of the epoxy resin being studied. Moreover, the UPS and UV/VIS analyses were merged to obtain the electron affinity of the E478 epoxy resin and to study the epoxy's energy band diagram and the tungsten-epoxy interface band structure. The results showed that the E478 epoxy resin is considered an n-type semiconductor of energy gap similar to 3.94 eV, local work function similar to 3.42 eV, ionization potential similar to 6.10 eV, electron affinity similar to 2.16 eV, and tungsten-epoxy Schottky contact barrier height similar to 2.50 eV.
This study provides comprehensive elemental, optical, and energy gap characteristics of the E478 single-component epoxy resin. This type of epoxy resin has imperative applications in medium voltage insulation and cold field emission of electrons. X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and hydrogen nuclear magnetic resonance (1H-NMR) were used to study the elemental and structural analyses, ultraviolet photoelectron spectroscopy (UPS) was used to obtain the local work function and the ionization potential energies, and ultraviolet/visible light spectroscopy (UV/VIS) was used to report the optical and energy gap characteristics of the epoxy resin being studied. Moreover, the UPS and UV/VIS analyses were merged to obtain the electron affinity of the E478 epoxy resin and to study the epoxy's energy band diagram and the tungsten-epoxy interface band structure. The results showed that the E478 epoxy resin is considered an n-type semiconductor of energy gap similar to 3.94 eV, local work function similar to 3.42 eV, ionization potential similar to 6.10 eV, electron affinity similar to 2.16 eV, and tungsten-epoxy Schottky contact barrier height similar to 2.50 eV.
This study provides comprehensive elemental, optical, and energy gap characteristics of the E478 single-component epoxy resin. This type of epoxy resin has imperative applications in medium voltage insulation and cold field emission of electrons. X-ray photoelectron spectroscopy (XPS), Raman spectroscopy, and hydrogen nuclear magnetic resonance (1H-NMR) were used to study the elemental and structural analyses, ultraviolet photoelectron spectroscopy (UPS) was used to obtain the local work function and the ionization potential energies, and ultraviolet/visible light spectroscopy (UV/VIS) was used to report the optical and energy gap characteristics of the epoxy resin being studied. Moreover, the UPS and UV/VIS analyses were merged to obtain the electron affinity of the E478 epoxy resin and to study the epoxy's energy band diagram and the tungsten-epoxy interface band structure. The results showed that the E478 epoxy resin is considered an n-type semiconductor of energy gap similar to 3.94 eV, local work function similar to 3.42 eV, ionization potential similar to 6.10 eV, electron affinity similar to 2.16 eV, and tungsten-epoxy Schottky contact barrier height similar to 2.50 eV.
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Keywords
Single component epoxy resin , field emission composite cathodes , tungsten-epoxy interface , Tauc and Urbach plots , electrical structure characteristics , Single component epoxy resin , field emission composite cathodes , tungsten-epoxy interface , Tauc and Urbach plots , electrical structure characteristics
Citation
ACS Omega. 2024, vol. 9, issue 28, p. 30975-30985.
https://pubs.acs.org/doi/10.1021/acsomega.4c04052
https://pubs.acs.org/doi/10.1021/acsomega.4c04052
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en
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Except where otherwised noted, this item's license is described as Creative Commons Attribution 4.0 International

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