Afm Of Hopg: Case Study Of Hopg Milling

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but.event.date23.04.2020cs
but.event.titleStudent EEICT 2020cs
dc.contributor.authorKomínek, Josef
dc.date.accessioned2021-07-15T11:17:19Z
dc.date.available2021-07-15T11:17:19Z
dc.date.issued2020cs
dc.description.abstractThe purpose of this work is study of highly oriented pyrolytic graphite (HOPG) processed by focused ion beam (FIB) using atomic force microscopy (AFM) and Raman spectroscopy. Due of its properties, HOPG have a promising potential and wide range of applications in nanotechnology. AFM demonstrates quality of the pattern created by FIB: topography of patterned area, shape of the edges, etc. Raman spectroscopy indicates defectiveness of the near surface area occurred due to FIB processing.en
dc.formattextcs
dc.format.extent159-162cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings I of the 26st Conference STUDENT EEICT 2020: General papers. s. 159-162. ISBN 978-80-214-5867-3cs
dc.identifier.isbn978-80-214-5867-3
dc.identifier.urihttp://hdl.handle.net/11012/200546
dc.language.isocscs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings I of the 26st Conference STUDENT EEICT 2020: General papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/EEICT2020cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjecttemplateen
dc.subjectguideen
dc.titleAfm Of Hopg: Case Study Of Hopg Millingen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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