Design Of An Automatic Testbed For Evaluation Of The Influence Of The Environment On The Function Of Infrared Proximity Sensors

but.event.date23.04.2020cs
but.event.titleStudent EEICT 2020cs
dc.contributor.authorRadvanský, Martin
dc.date.accessioned2021-07-15T11:17:18Z
dc.date.available2021-07-15T11:17:18Z
dc.date.issued2020cs
dc.description.abstractProximity or obstacle detection is one of the everyday tasks to be solved in practice. Many sensors can be used for this purpose and usually is achieved by high detection accuracy. The problem occurs when the sensor is placed in an environment where the light conditions change, or one or more sensors are within the visibility range of the sensor. Manufacturers often do not provide all the necessary information about the behaviour of the sensor in such a disturbed environment in the product datasheets. This project is focused on the design of an automated testbed that will allow evaluation of the behaviour of the sensor during external interference. For testing purpose modulated visible and infrared radiation is used.en
dc.formattextcs
dc.format.extent71-74cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings I of the 26st Conference STUDENT EEICT 2020: General papers. s. 71-74. ISBN 978-80-214-5867-3cs
dc.identifier.isbn978-80-214-5867-3
dc.identifier.urihttp://hdl.handle.net/11012/200523
dc.language.isocscs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings I of the 26st Conference STUDENT EEICT 2020: General papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/EEICT2020cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectTestbeden
dc.subjectIR sensorsen
dc.subjectArduino DUEen
dc.subjectRaspberry PIen
dc.titleDesign Of An Automatic Testbed For Evaluation Of The Influence Of The Environment On The Function Of Infrared Proximity Sensorsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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