Microcode-Controlled Ram Bist
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Date
2017
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Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract
This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.
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Citation
Proceedings of the 23st Conference STUDENT EEICT 2017. s. 236-238. ISBN 978-80-214-5496-5
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
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Peer-reviewed
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cs
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií