Microcode-Controlled Ram Bist
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Date
Authors
Lukáš, Vykydal
Advisor
Referee
Mark
Journal Title
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Volume Title
Publisher
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
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Abstract
This paper deals with memory testing principles, focusing mainly on March algorithms. It describes their usage on word based memories. In second part it proposes small programmable BIST controller that can be used in digital circuits.
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Citation
Proceedings of the 23st Conference STUDENT EEICT 2017. s. 236-238. ISBN 978-80-214-5496-5
http://www.feec.vutbr.cz/EEICT/
http://www.feec.vutbr.cz/EEICT/
Document type
Peer-reviewed
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Published version
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cs