Assessment of noise sources in resistors

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but.event.date23.04.2015cs
but.event.titleStudent EEICT 2015cs
dc.contributor.authorKuparowitz, T.
dc.date.accessioned2015-08-25T08:43:05Z
dc.date.available2015-08-25T08:43:05Z
dc.date.issued2015cs
dc.description.abstractThermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shelf resistors. Samples of carbon film, metal oxide, and cement fixed wire-wound resistors are evaluated. Measurement setup is created to acquire their noise spectral density. Their Noise Index and Hooge's constant are calculated and their useability in low-noise measurement setup is assessed.en
dc.formattextcs
dc.format.extent418-422cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 21st Conference STUDENT EEICT 2015. s. 418-422. ISBN 978-80-214-5148-3cs
dc.identifier.isbn978-80-214-5148-3
dc.identifier.urihttp://hdl.handle.net/11012/43035
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 21st Conference STUDENT EEICT 2015en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectthermal noiseen
dc.subject1/f noiseen
dc.subjectnoise indexen
dc.subjectnoise spectral densityen
dc.subjectmetal oxide film resistoren
dc.subjectcarbon film fixed resistoren
dc.subjectcement fixed wire-wound resistoren
dc.titleAssessment of noise sources in resistorsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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