Atomic force microscopy analysis of nanoparticles in non-ideal conditions

Simple item page
dc.contributor.authorKlapetek, Petrcs
dc.contributor.authorValtr, Miroslavcs
dc.contributor.authorNečas, Davidcs
dc.contributor.authorSalyk, Otacs
dc.contributor.authorDzik, Petrcs
dc.coverage.issue1cs
dc.coverage.volume6cs
dc.date.issued2011-08-30cs
dc.description.abstractNanoparticles are often measured using atomic force microscopy or other scanning probe microscopy methods. For isolated nanoparticles on flat substrates, this is a relatively easy task. However, in real situations, we often need to analyze nanoparticles on rough substrates or nanoparticles that are not isolated. In this article, we present a simple model for realistic simulations of nanoparticle deposition and we employ this model for modeling nanoparticles on rough substrates. Different modeling conditions (coverage, relaxation after deposition) and convolution with different tip shapes are used to obtain a wide spectrum of virtual AFM nanoparticle images similar to those known from practice. Statistical parameters of nanoparticles are then analyzed using different data processing algorithms in order to show their systematic errors and to estimate uncertainties for atomic force microscopy analysis of nanoparticles under non-ideal conditions. It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions.en
dc.description.abstractNanoparticles are often measured using atomic force microscopy or other scanning probe microscopy methods. For isolated nanoparticles on flat substrates, this is a relatively easy task. However, in real situations, we often need to analyze nanoparticles on rough substrates or nanoparticles that are not isolated. In this article, we present a simple model for realistic simulations of nanoparticle deposition and we employ this model for modeling nanoparticles on rough substrates. Different modeling conditions (coverage, relaxation after deposition) and convolution with different tip shapes are used to obtain a wide spectrum of virtual AFM nanoparticle images similar to those known from practice. Statistical parameters of nanoparticles are then analyzed using different data processing algorithms in order to show their systematic errors and to estimate uncertainties for atomic force microscopy analysis of nanoparticles under non-ideal conditions. It is shown that the elimination of user influence on the data processing algorithm is a key step for obtaining accurate results while analyzing nanoparticles measured in non-ideal conditions.cs
dc.formattextcs
dc.format.extent1-9cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationNanoscale Research Letters. 2011, vol. 6, issue 1, p. 1-9.en
dc.identifier.doi10.1186/1556-276X-6-514cs
dc.identifier.issn1931-7573cs
dc.identifier.orcid0000-0001-5241-9178cs
dc.identifier.orcid0000-0001-7731-8453cs
dc.identifier.orcid0000-0003-0231-3855cs
dc.identifier.orcid0000-0002-9774-3497cs
dc.identifier.other75129cs
dc.identifier.researcheridD-6819-2012cs
dc.identifier.researcheridD-7166-2012cs
dc.identifier.researcheridI-8500-2012cs
dc.identifier.urihttp://hdl.handle.net/11012/137965
dc.language.isoencs
dc.publisherSpringer Opencs
dc.relation.ispartofNanoscale Research Letterscs
dc.relation.urihttps://nanoscalereslett.springeropen.com/articles/10.1186/1556-276X-6-514cs
dc.rightsCreative Commons Attribution 2.0 Genericcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1931-7573/cs
dc.rights.urihttp://creativecommons.org/licenses/by/2.0/cs
dc.subjectatomic force microscopyen
dc.subjectpalladiumen
dc.subjectnanoparticleen
dc.subjectmikroskopie atomárních sil
dc.subjectpaladium
dc.subjectnanočástice
dc.titleAtomic force microscopy analysis of nanoparticles in non-ideal conditionsen
dc.title.alternativeAtomic force microscopy analysis of nanoparticles in non-ideal conditionscs
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-75129en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:38:49en
sync.item.modts2025.01.17 18:43:09en
thesis.grantorVysoké učení technické v Brně. Fakulta chemická. Ústav fyzikální a spotřební chemiecs
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
1556276X6514.pdf
Size:
1.13 MB
Format:
Adobe Portable Document Format
Description:
1556276X6514.pdf
Download
Collections
Ústav fyzikální a spotřební chemie