Design Of A Semi-Automatic Positioning System For Measuring Of Semiconductor Chips
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Date
2021
Authors
Kotian, Tomáš
ORCID
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Referee
Mark
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Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract
The aim of this work is to design a semi-automatic positioning system for the testof semiconductor chips. The work solves the problems with the implementation of the constructionto achieve the highest possible accuracy for contacting with probe card. Next, the work deals withthe selection of a suitable control unit for stepper motors and finally to create a program to controlthe system and display image from the camera to the computer. The last requirement for the programis detection of chips with the camera image and automatic centering with a probe card.
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Citation
Proceedings I of the 27st Conference STUDENT EEICT 2021: General papers. s. 58-61. ISBN 978-80-214-5942-7
https://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazeni
https://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazeni
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Peer-reviewed
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cs
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© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií