Field Electron Emission Performance And Orthodoxy Test Of Tungsten Emitters With And Without Thin Tungsten Trioxide Barrier

Abstract

This initial study aims to explore the topic of thin barrier layers for single tip cold field emitters. The experiment and measurements have been conducted in ultra-high vacuum field electron microscope. Additionally, micrographs of the emitter were obtained using scanning electron microscope. The performance of the emitter was evaluated using orthodoxy test and Murphy-Good plots, which can give more complete picture of emitter changes during field emission.