Investigating Battery Degradation Mechanisms by In-Situ SEM Analysis and Related Techniques

but.event.date29.04.2025cs
but.event.titleSTUDENT EEICT 2025cs
dc.contributor.authorTrochta, David
dc.contributor.authorKlvač, Ondřej
dc.contributor.authorKazda, Tomáš
dc.date.accessioned2025-07-30T10:03:11Z
dc.date.available2025-07-30T10:03:11Z
dc.date.issued2025cs
dc.description.abstractThis paper explores the application of in-situ Scanning Electron Microscopy (in-situ SEM) for real-time analysis of lithium-ion (Li-ion) battery materials, enabling high-resolution imaging of structural and morphological changes such as SEI formation, lithium plating, dendrite growth, and particle cracking. Integrating in-situ SEM with techniques like Atomic Force Microscopy (AFM), X-ray Photoelectron Spectroscopy (XPS), and X-ray Diffraction (XRD) enhances battery analysis by providing complementary chemical and structural insights. Emphasizing the unique capabilities of in-situ SEM, this work highlights its potential in studying next-generation battery chemistry and improving battery design and safety.en
dc.formattextcs
dc.format.extent170-174cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings II of the 31st Conference STUDENT EEICT 2025: Selected papers. s. 170-174. ISBN 978-80-214-6320-2cs
dc.identifier.doi10.13164/eeict.2025.170
dc.identifier.isbn978-80-214-6320-2
dc.identifier.issn2788-1334
dc.identifier.urihttps://hdl.handle.net/11012/255346
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings II of the 31st Conference STUDENT EEICT 2025: Selected papersen
dc.relation.urihttps://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2025_sbornik_2.pdfcs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectLi-ionen
dc.subjectbatteryen
dc.subjectdegradationen
dc.subjectin-situen
dc.subjectSEMen
dc.titleInvestigating Battery Degradation Mechanisms by In-Situ SEM Analysis and Related Techniquesen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
170-Trochta.pdf
Size:
609.9 KB
Format:
Adobe Portable Document Format