Low-Level Measurements

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but.event.date26.04.2022cs
but.event.titleSTUDENT EEICT 2022cs
dc.contributor.authorZdražil, Lukáš
dc.contributor.authorRoubal, Zdeněk
dc.date.accessioned2022-12-06T13:22:00Z
dc.date.available2022-12-06T13:22:00Z
dc.date.issued2022cs
dc.description.abstractThis paper deals with the measurement of low values of electrical voltages and currents from sources with high internal resistance. The measured values are close to the theoretical limits of achievable sensitivity, which are determined by the magnitude of the Johnson´s thermal noise. Non-thermal noises are also generated in the circuit. The most significant noise after Johnson´s thermal noise is flicker noise with a frequency dependence of 1/f. Choosing an accurate operational amplifier with low input bias and noise is just as important as choosing precise passive components with low noise.en
dc.formattextcs
dc.format.extent259-263cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings II of the 28st Conference STUDENT EEICT 2022: Selected papers. s. 259-263. ISBN 978-80-214-6030-0cs
dc.identifier.doi10.13164/eeict.2022.259
dc.identifier.isbn978-80-214-6030-0
dc.identifier.urihttp://hdl.handle.net/11012/208648
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings II of the 28st Conference STUDENT EEICT 2022: Selected papersen
dc.relation.urihttps://conf.feec.vutbr.cz/eeict/index/pages/view/ke_stazenics
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectlow-level measurements, operational amplifiers, voltage noise, current noiseen
dc.titleLow-Level Measurementsen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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