Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells
dc.contributor.author | Talu, Stefan | cs |
dc.contributor.author | Papež, Nikola | cs |
dc.contributor.author | Sobola, Dinara | cs |
dc.contributor.author | Tofel, Pavel | cs |
dc.date.issued | 2018-02-11 | cs |
dc.description.abstract | This article is devoted to study of Atomic Force Microscopy (AFM) images of solar cells based on gallium arsenide (GaAs). Mathematical processing of data involves obtaining additional information about topography. The analysis was carried out using AFM data for GaAs solar cells, before and after temperature treatment. The state of the surface affects the reflectivity, so the structuring of the surface is of particular interest. Optimized textures are needed to improve the optical properties of surfaces. Fractal analysis allows quantifying the condition of the morphology of the surface on the basis of AFM data. | en |
dc.description.abstract | Tento článek je věnován studiu AFM obrazů solárních článků na bázi arsenidu gallia (GaAs). | cs |
dc.format | text | cs |
dc.format.extent | 489-493 | cs |
dc.format.mimetype | application/pdf | cs |
dc.identifier.citation | DEStech Transactions on Environment, Energy and Earth Sciences. 2018, p. 489-493. | en |
dc.identifier.isbn | 978-1-60595-514-8 | cs |
dc.identifier.issn | 2475-8833 | cs |
dc.identifier.orcid | 0000-0003-2297-2890 | cs |
dc.identifier.orcid | 0000-0002-0008-5265 | cs |
dc.identifier.orcid | 0000-0002-4779-7024 | cs |
dc.identifier.other | 145480 | cs |
dc.identifier.researcherid | Y-9823-2019 | cs |
dc.identifier.researcherid | G-1175-2019 | cs |
dc.identifier.researcherid | E-2376-2012 | cs |
dc.identifier.scopus | 57195963424 | cs |
dc.identifier.scopus | 57189064262 | cs |
dc.identifier.uri | http://hdl.handle.net/11012/70923 | |
dc.language.iso | en | cs |
dc.publisher | DEStech Publications, Inc. | cs |
dc.relation.ispartof | DEStech Transactions on Environment, Energy and Earth Sciences | cs |
dc.relation.uri | http://dpi-proceedings.com/index.php/dteees/article/view/18173 | cs |
dc.rights | (C) DEStech Publications, Inc. | cs |
dc.rights.access | openAccess | cs |
dc.rights.sherpa | http://www.sherpa.ac.uk/romeo/issn/2475-8833/ | cs |
dc.subject | Atomic Force Microscopy | en |
dc.subject | Fractal dimension | en |
dc.subject | Temperature stress | en |
dc.subject | Topography | en |
dc.subject | ASM | |
dc.subject | fraktální rozměr | |
dc.subject | teplotní stres | |
dc.subject | topografie | |
dc.title | Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells | en |
dc.title.alternative | Fraktální analýza 3-D topografie solárních článků GaAs | cs |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
sync.item.dbid | VAV-145480 | en |
sync.item.dbtype | VAV | en |
sync.item.insts | 2025.02.03 15:40:37 | en |
sync.item.modts | 2025.01.17 18:35:22 | en |
thesis.grantor | Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav fyziky | cs |
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