Two-dimensional quantitative near-field phase imaging using square and hexagonal interference devices

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dc.contributor.authorViewegh, Petrcs
dc.contributor.authorKlok, Pavelcs
dc.contributor.authorKvapil, Michalcs
dc.contributor.authorHrtoň, Martincs
dc.contributor.authorBouchal, Petrcs
dc.contributor.authorKrpenský, Jancs
dc.contributor.authorKřápek, Vlastimilcs
dc.contributor.authorŠikola, Tomášcs
dc.coverage.issue19cs
dc.coverage.volume11cs
dc.date.issued2022-08-26cs
dc.description.abstractWe demonstrate the formation of the near field with non-trivial phase distribution using surface plasmon interference devices, and experimental quantitative imaging of that phase with near-field phase microscopy. The phase distribution formed with a single device can be controlled by the polarization of the external illumination and the area of the device assigned to the object wave. A comparison of the experimental data to a numerical electromagnetic model and an analytical model assigns the origin of the near-field phase to the out-of-plane electric component of surface plasmon polaritons, and also verifies the predictive power of the models. We demonstrate a formation of near-field plane waves with different propagation directions on a single device, or even simultaneously at distinct areas of a single device. Our findings open the way to the imaging and tomography of phase objects in the near field.en
dc.formattextcs
dc.format.extent1-12cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationNanophotonics. 2022, vol. 11, issue 19, p. 1-12.en
dc.identifier.doi10.1515/nanoph-2022-0215cs
dc.identifier.issn2192-8614cs
dc.identifier.orcid0000-0003-3659-9249cs
dc.identifier.orcid0009-0000-9556-4455cs
dc.identifier.orcid0000-0002-2712-1991cs
dc.identifier.orcid0000-0002-3264-4025cs
dc.identifier.orcid0000-0002-6159-8099cs
dc.identifier.orcid0000-0002-4047-8653cs
dc.identifier.orcid0000-0003-4217-2276cs
dc.identifier.other178969cs
dc.identifier.researcheridA-9810-2014cs
dc.identifier.researcheridGQX-0322-2022cs
dc.identifier.researcheridV-6971-2018cs
dc.identifier.researcheridV-8613-2018cs
dc.identifier.researcheridG-8464-2014cs
dc.identifier.researcheridA-6917-2013cs
dc.identifier.scopus57218886044cs
dc.identifier.scopus57189694006cs
dc.identifier.scopus55490754800cs
dc.identifier.urihttp://hdl.handle.net/11012/208473
dc.language.isoencs
dc.publisherDe Gruytercs
dc.relation.ispartofNanophotonicscs
dc.relation.urihttps://www.degruyter.com/document/doi/10.1515/nanoph-2022-0215/htmlcs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2192-8614/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectinterference nanostructuresen
dc.subjectnear-fielden
dc.subjectphase imagingen
dc.subjectSNOMen
dc.subjectSPP wavesen
dc.titleTwo-dimensional quantitative near-field phase imaging using square and hexagonal interference devicesen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-178969en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:48:20en
sync.item.modts2025.01.17 15:17:51en
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav fyzikálního inženýrstvícs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Experimentální biofotonikacs
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Příprava a charakterizace nanostrukturcs
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