Chalcopyrite Solar Cells
but.event.date | 27.04.2017 | cs |
but.event.title | Student EEICT 2017 | cs |
dc.contributor.author | Škvarenina, Ľubomír | |
dc.date.accessioned | 2020-05-07T09:40:34Z | |
dc.date.available | 2020-05-07T09:40:34Z | |
dc.date.issued | 2017 | cs |
dc.description.abstract | Thin-film chalcopyrite based Cu(In;Ga)Se2 solar cells with a metal wrap through interconnection were investigated by non-destructive methods in our research. The primary focus of this investigation was a detection and a localization of microstructural defects in this type of Cu(In;Ga)Se2 solar cells. A combination of a visible and near infrared electroluminescence with a lock-in thermography was used for these purposes. Mainly the electroluminescence was a very sensitive tool for an indication of pre-breakdown sites influenced by a trap-assisted tunneling or stress-induced leakage currents. A strong correlation between electroluminescence maps and lock-in thermograms was obtained after a local breakdown accompanied by a creation of permanent defect. | en |
dc.format | text | cs |
dc.format.extent | 690-694 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Proceedings of the 25st Conference STUDENT EEICT 2019. s. 690-694. ISBN 978-80-214-5735-5 | cs |
dc.identifier.isbn | 978-80-214-5496-5 | |
dc.identifier.uri | http://hdl.handle.net/11012/187191 | |
dc.language.iso | en | cs |
dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.relation.ispartof | Proceedings of the 23st Conference STUDENT EEICT 2017 | en |
dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.rights.access | openAccess | en |
dc.subject | thin-film | en |
dc.subject | CIGS | en |
dc.subject | IR lock-in | en |
dc.subject | electroluminescence | en |
dc.subject | metal wrap through | en |
dc.title | Chalcopyrite Solar Cells | en |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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