Analytical electron microscopy analysis of insulating and metallic phases in nanostructured vanadium dioxide

dc.contributor.authorKrpenský, Jancs
dc.contributor.authorHorák, Michalcs
dc.contributor.authorKabát, Jiřícs
dc.contributor.authorPlaner, Jakubcs
dc.contributor.authorKepič, Petercs
dc.contributor.authorKřápek, Vlastimilcs
dc.contributor.authorKonečná, Andreacs
dc.coverage.issue13cs
dc.coverage.volume2024cs
dc.date.issued2024-05-03cs
dc.description.abstractVanadium dioxide (VO2) is a strongly correlated material that exhibits the insulator-to-metal transition (IMT) near room temperature, which makes it a promising candidate for applications in nanophotonics or optoelectronics. However, creating VO2 nanostructures with the desired functionality can be challenging due to microscopic inhomogeneities that can significantly impact the local optical and electronic properties. Thin lamellas, produced by focused ion beam milling from a homogeneous layer, provide a useful prototype for studying VO2 at the truly microscopic level using a scanning transmission electron microscope (STEM). High-resolution imaging is used to identify structural inhomogeneities while electron energy-loss spectroscopy (EELS) supported by statistical analysis helps to detect VxOy stoichiometries with a reduced oxidation number of vanadium at the areas of thickness below 70 nm. On the other hand, the thicker areas are dominated by vanadium dioxide, where the signatures of the IMT are detected in both core-loss and low-loss EELS experiments with in situ heating. The experimental results are interpreted with ab initio and semi-classical calculations. This work shows that structural inhomogeneities such as pores and cracks present no harm to the desired optical properties of VO2 samples. We utilize analytical electron microscopy with in situ heating to observe the insulator-metal transition in vanadium dioxide and to identify additional vanadium oxides across the sample exhibiting nanoscopic pores and cracks.en
dc.formattextcs
dc.format.extent3338-3346cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationNANOSCALE ADVANCES. 2024, vol. 2024, issue 13, p. 3338-3346.en
dc.identifier.doi10.1039/d4na00338acs
dc.identifier.issn2516-0230cs
dc.identifier.orcid0000-0001-6503-8294cs
dc.identifier.orcid0009-0002-9918-0402cs
dc.identifier.orcid0000-0002-9098-1900cs
dc.identifier.orcid0000-0002-4047-8653cs
dc.identifier.orcid0000-0002-7423-5481cs
dc.identifier.other188816cs
dc.identifier.researcheridR-2546-2017cs
dc.identifier.researcheridA-6917-2013cs
dc.identifier.researcheridAAI-4838-2020cs
dc.identifier.scopus57200608539cs
dc.identifier.scopus57222250201cs
dc.identifier.urihttp://hdl.handle.net/11012/249368
dc.language.isoencs
dc.publisherRoyal Society of Chemistrycs
dc.relation.ispartofNANOSCALE ADVANCEScs
dc.relation.urihttps://pubs.rsc.org/en/content/articlelanding/2024/na/d4na00338acs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2516-0230/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectENERGY-LOSSen
dc.subjectIN-SITUen
dc.subjectVO2en
dc.subjectTRANSITIONen
dc.subjectEELSen
dc.subjectSPECTROSCOPYen
dc.subjectDYNAMICSen
dc.subjectOXIDESen
dc.subjectFILMSen
dc.subjectTEMen
dc.titleAnalytical electron microscopy analysis of insulating and metallic phases in nanostructured vanadium dioxideen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-188816en
sync.item.dbtypeVAVen
sync.item.insts2024.12.10 14:55:40en
sync.item.modts2024.10.28 18:32:00en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Příprava a charakterizace nanostrukturcs
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav fyzikálního inženýrstvícs
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