Microstructural investigation of defects in photovoltaic cells by the electron beam-induced current method

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dc.contributor.authorPapež, Nikolacs
dc.contributor.authorDallaev, Rashidcs
dc.contributor.authorSobola, Dinaracs
dc.contributor.authorMacků, Robertcs
dc.contributor.authorŠkarvada, Pavelcs
dc.coverage.issue1cs
dc.coverage.volume23cs
dc.date.issued2020-02-19cs
dc.description.abstractThis work aims to clarify the application of electron beam-induced current (EBIC) method for the morphological analysis and detection of local defects and impurities in semiconductor structures such as solar cells. One of the advantages of this method is to observe a leakage path and microplasma sites with nanometer resolution. This technique allows to precisely locate the affected area and determine the type of defect that cannot be commonly characterized with sufficient accuracy. Simultaneously, a focused ion beam could be used to determine junction by milling of the samples at the area of interest. The evaluation results of experimental measurement using these techniques on photovoltaic cells illustrates the applicability and importance of the EBIC method.en
dc.formattextcs
dc.format.extent595-600cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationProcedia Structural Integrity. 2020, vol. 23, issue 1, p. 595-600.en
dc.identifier.doi10.1016/j.prostr.2020.01.151cs
dc.identifier.issn2452-3216cs
dc.identifier.orcid0000-0003-2297-2890cs
dc.identifier.orcid0000-0002-6823-5725cs
dc.identifier.orcid0000-0002-0008-5265cs
dc.identifier.orcid0000-0002-0811-2432cs
dc.identifier.orcid0000-0002-8059-7761cs
dc.identifier.other161694cs
dc.identifier.researcheridY-9823-2019cs
dc.identifier.researcheridAAE-8648-2020cs
dc.identifier.researcheridG-1175-2019cs
dc.identifier.researcheridE-2382-2012cs
dc.identifier.scopus57195963424cs
dc.identifier.scopus57201461813cs
dc.identifier.scopus57189064262cs
dc.identifier.scopus23767216400cs
dc.identifier.urihttp://hdl.handle.net/11012/193483
dc.language.isoencs
dc.publisherElseviercs
dc.relation.ispartofProcedia Structural Integritycs
dc.relation.urihttps://www.sciencedirect.com/science/article/pii/S2452321620302183cs
dc.rightsCreative Commons Attribution-NonCommercial-NoDerivatives 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/2452-3216/cs
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/cs
dc.subjectebicen
dc.subjectstructural analysisen
dc.subjectsolar cellsen
dc.subjectdefectsen
dc.titleMicrostructural investigation of defects in photovoltaic cells by the electron beam-induced current methoden
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-161694en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:40:24en
sync.item.modts2025.01.17 15:21:19en
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav fyzikycs
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