Electrical Characterization of Epoxy Nanocomposite under High DC Voltage
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Date
2024-04-01
Authors
Alsoud, Ammar Awadallah Ahmad
Daradkeh, Samer Issa Abdel Razzaq
Al-Bashaish, Saleh R.
Shaheen, Adel A
Ahmad, M D (Assa’d) Jaber
Abuamr, Adel M.
Mousa, Marwan Suleiman
Holcman, Vladimír
ORCID
0000-0001-7402-4660Advisor
Referee
Mark
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MDPI
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Abstract
This work studies the direct current breakdown characteristics of unfilled epoxy and epoxy nonconductive nanocomposites (SiO2,MgO and Al2O3). It also examines the variation of electrical properties in epoxy nanocomposites. The novel aspect of this study is that the samples of Epoxy nanocomposite were exposed to high voltages of up to six kilo volts for three hours using field electron microscopy under high vacuum conditions (10-5 mbar). The current emitted from these samples was measured at three different intervals of time. In addition, the influence of high voltage on the permittivity, loss factor (tan(delta)), and conductivity of the epoxy nanocomposite was studied. This evaluation was conducted before and after applying the voltage at room temperature, The frequency range extends from 10-2-10-7 Hz using the Novo Control Alpha-A analyzer. Current-voltage characterization was performed through field electron microscopy. The samples were characterized by scanning electron microscopy-energy dispersive X-ray spectroscopy and Fourier Transform Infrared Spectroscopy. The unfilled epoxy exhibited structural degradation, resulting in the formation of holes when exposed to high voltages of up to six kilo volts, leading to a reduction in electrical properties. Nevertheless, the addition of nanoparticles shows a significant increase in the operational lifetime of the epoxy nanocomposite. The degree of increase in the lifetime of epoxy composite varied depending on several factors such as the type of NPs introduced and their respective sizes. The epoxy/Al2O3 nanocomposite comparing with epoxy/MgO and epoxy/SiO2 nanocomposite showed elevated resistance to direct current breakdown strength and maintaining its dielectric.
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Peer-reviewed
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en