Exploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Study

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dc.contributor.authorMisiurev, Deniscs
dc.contributor.authorKaspar, Pavelcs
dc.contributor.authorSobola, Dinaracs
dc.contributor.authorPapež, Nikolacs
dc.contributor.authorFawaeer, Saleh Hekmat Salehcs
dc.contributor.authorHolcman, Vladimírcs
dc.coverage.issue8cs
dc.coverage.volume16cs
dc.date.issued2023-04-18cs
dc.description.abstractOver recent decades, the scientific community has managed to make great progress in the theoretical investigation and practical characterization of bismuth ferrite thin films. However, there is still much work to be completed in the field of magnetic property analysis. Under a normal operational temperature, the ferroelectric properties of bismuth ferrite could overcome the magnetic properties due to the robustness of ferroelectric alignment. Therefore, investigation of the ferroelectric domain structure is crucial for functionality of any potential devices. This paper reports deposition and analyzation of bismuth ferrite thin films by Piezoresponse Force Microscopy (PFM) and XPS methods, aiming to provide a characterization of deposited thin films. In this paper, thin films of 100 nm thick bismuth ferrite material were prepared by pulsed laser deposition on multilayer substrates Pt/Ti(TiO2)/Si. Our main purpose for the PFM investigation in this paper is to determine which magnetic pattern will be observed on Pt/Ti/Si and Pt/TiO2/Si multilayer substrates under certain deposition parameters by utilizing the PLD method and using samples of a deposited thickness of 100 nm. It was also important to determine how strong the measured piezoelectric response will be, considering parameters mentioned previously. By establishing a clear understanding of how prepared thin films react on various biases, we have provided a foundation for future research involving the formation of piezoelectric grains, thickness-dependent domain wall formations, and the effect of the substrate topology on the magnetic properties of bismuth ferrite films.en
dc.formattextcs
dc.format.extent1-18cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationMaterials . 2023, vol. 16, issue 8, p. 1-18.en
dc.identifier.doi10.3390/ma16083203cs
dc.identifier.issn1996-1944cs
dc.identifier.orcid0000-0003-1757-2382cs
dc.identifier.orcid0000-0002-0008-5265cs
dc.identifier.orcid0000-0003-2297-2890cs
dc.identifier.orcid0000-0001-5707-2978cs
dc.identifier.orcid0000-0001-7402-4660cs
dc.identifier.other183602cs
dc.identifier.researcheridH-1293-2014cs
dc.identifier.researcheridG-1175-2019cs
dc.identifier.researcheridY-9823-2019cs
dc.identifier.researcheridE-2366-2012cs
dc.identifier.scopus56516508200cs
dc.identifier.scopus57189064262cs
dc.identifier.scopus57195963424cs
dc.identifier.scopus57224727618cs
dc.identifier.scopus25928429400cs
dc.identifier.urihttp://hdl.handle.net/11012/213821
dc.language.isoencs
dc.publisherMDPIcs
dc.relation.ispartofMaterialscs
dc.relation.urihttps://www.mdpi.com/1996-1944/16/8/3203cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1996-1944/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectmultiferroicen
dc.subjectnanomaterialsen
dc.subjectferroelectricen
dc.subjectbismuth ferriteen
dc.subjectthin filmen
dc.subjectXPSen
dc.subjectAFMen
dc.subjectPFMen
dc.subjectPLDen
dc.titleExploring the Piezoelectric Properties of Bismuth Ferrite Thin Films Using Piezoelectric Force Microscopy: A Case Studyen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-183602en
sync.item.dbtypeVAVen
sync.item.insts2024.01.03 16:01:33en
sync.item.modts2024.01.02 20:22:34en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Pokročilé keramické materiálycs
thesis.grantorVysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií. Ústav fyzikycs
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