Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

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dc.contributor.authorStöger-Pollach, Michaelcs
dc.contributor.authorLöffler, Stefancs
dc.contributor.authorMaurer, Niklascs
dc.contributor.authorBukvišová, Kristýnacs
dc.coverage.issue1cs
dc.coverage.volume214cs
dc.date.issued2020-07-01cs
dc.description.abstractCathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Perot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).en
dc.formattextcs
dc.format.extent1-5cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationUltramicroscopy. 2020, vol. 214, issue 1, p. 1-5.en
dc.identifier.doi10.1016/j.ultramic.2020.113011cs
dc.identifier.issn0304-3991cs
dc.identifier.orcid0000-0001-8530-8298cs
dc.identifier.other165496cs
dc.identifier.urihttp://hdl.handle.net/11012/195860
dc.language.isoencs
dc.publisherElseviercs
dc.relation.ispartofUltramicroscopycs
dc.relation.urihttps://www.sciencedirect.com/science/article/pii/S0304399120300073cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/0304-3991/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subjectCerenkoven
dc.subjectRadiationen
dc.subjectCathodoluminescenceen
dc.subjectVEELSen
dc.titleUsing Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescenceen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-165496en
sync.item.dbtypeVAVen
sync.item.insts2025.02.03 15:51:26en
sync.item.modts2025.01.17 22:32:03en
thesis.grantorVysoké učení technické v Brně. Středoevropský technologický institut VUT. Příprava a charakterizace nanostrukturcs
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Příprava a charakterizace nanostruktur