Basic Measurement of Dynamic Properties of Amplifier with Bipolar Transistor

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but.event.date23.04.2015cs
but.event.titleStudent EEICT 2015cs
dc.contributor.authorRepčík, J.
dc.date.accessioned2015-08-25T08:42:50Z
dc.date.available2015-08-25T08:42:50Z
dc.date.issued2015cs
dc.description.abstractThe aim of this article is to analyze the theoretical basis of amplifier with bipolar transistors measurement. In particular, this contribution focuses on a convenient way of setting the operating point of an amplifier with BJT and subsequently on measuring particular dynamic properties. To accomplish this, the automated laboratory measurement was developed, by using appropriate measurement devices along with LabVIEW software.en
dc.formattextcs
dc.format.extent109-111cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 21st Conference STUDENT EEICT 2015. s. 109-111. ISBN 978-80-214-5148-3cs
dc.identifier.isbn978-80-214-5148-3
dc.identifier.urihttp://hdl.handle.net/11012/42946
dc.language.isoskcs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 21st Conference STUDENT EEICT 2015en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjecttransistoren
dc.subjectoperating pointen
dc.subjectbipolaren
dc.subjectLabVIEWen
dc.subjectTHDen
dc.subjectlinearityen
dc.titleBasic Measurement of Dynamic Properties of Amplifier with Bipolar Transistoren
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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