Different imaging techniques for investigation of treatment effects on various substrate surfaces

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but.event.date23.04.2015cs
but.event.titleStudent EEICT 2015cs
dc.contributor.authorChmela, O.
dc.date.accessioned2015-08-25T08:43:02Z
dc.date.available2015-08-25T08:43:02Z
dc.date.issued2015cs
dc.description.abstractThe different imaging techniques were used for measurement of the properties changes on substrate surfaces. In this paper we report about testing various treatment on different substrates following investigation and characterization of the advantages/disadvantages of these methods for future applications. We usually used flexible materials such as polyethylene terephthalate (PET) and poly-carbonate (PC) for treatment. We also used glass substrate and aluminum oxide (Al2O3) to determine the efficiency of oxide plasma etching. As imaging techniques mainly atomic force microscopy (AFM), scanning electron microscopy (SEM), contact angle measurement and a special method for examination of layer adhesion known as a scratch test were used.en
dc.formattextcs
dc.format.extent351-355cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationProceedings of the 21st Conference STUDENT EEICT 2015. s. 351-355. ISBN 978-80-214-5148-3cs
dc.identifier.isbn978-80-214-5148-3
dc.identifier.urihttp://hdl.handle.net/11012/43022
dc.language.isoencs
dc.publisherVysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.relation.ispartofProceedings of the 21st Conference STUDENT EEICT 2015en
dc.relation.urihttp://www.feec.vutbr.cz/EEICT/cs
dc.rights© Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologiícs
dc.rights.accessopenAccessen
dc.subjectsubstrate treatmenten
dc.subjectcleaningen
dc.subjectAFMen
dc.subjectoxide plasmaen
dc.subjectcontact angleen
dc.subjectSEMen
dc.titleDifferent imaging techniques for investigation of treatment effects on various substrate surfacesen
dc.type.driverconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.departmentFakulta elektrotechniky a komunikačních technologiícs
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