Digital Offset Calibration of an OPAMP Towards Improving Static Parameters of 90 nm CMOS DAC

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dc.contributor.authorArbet, Daniel
dc.contributor.authorNagy, Gabriel
dc.contributor.authorStopjakova, Viera
dc.contributor.authorKovac, Martin
dc.coverage.issue3cs
dc.coverage.volume23cs
dc.date.accessioned2014-12-11T12:45:23Z
dc.date.available2014-12-11T12:45:23Z
dc.date.issued2014-09cs
dc.description.abstractIn this paper, an on-chip self-calibrated 8-bit R-2R digital-to-analog converter (DAC) based on digitally compensated input offset of the operational amplifier (OPAMP) is presented. To improve the overall DAC performance, a digital offset cancellation method was used to compensate deviations in the input offset voltage of the OPAMP caused by process variations. The whole DAC as well as offset compensation circuitry were designed in a standard 90 nm CMOS process. The achieved results show that after the self-calibration process, the improvement of 48% in the value of DAC offset error is achieved.en
dc.formattextcs
dc.format.extent931-938cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2014, vol. 23, č. 3, s. 931-938. ISSN 1210-2512cs
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/36517
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttp://www.radioeng.cz/fulltexts/2014/14_03_0931_0938.pdfcs
dc.rightsCreative Commons Attribution 3.0 Unported Licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/en
dc.subjectself-calibrationen
dc.subjectdigital to analog converteren
dc.subjectinput offset voltage trimmingen
dc.titleDigital Offset Calibration of an OPAMP Towards Improving Static Parameters of 90 nm CMOS DACen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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