An EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Cores

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dc.contributor.authorKrolak, D.
dc.contributor.authorHorsky, P.
dc.coverage.issue3cs
dc.coverage.volume31cs
dc.date.accessioned2022-08-15T08:55:02Z
dc.date.available2022-08-15T08:55:02Z
dc.date.issued2022-09cs
dc.description.abstractThis paper presents a comparative EMC susceptibility study of various integrated bandgap voltage reference cores. Conventional well-known bandgap references based on Kuijk, Brokaw and Tsividis concepts with reduced count of bipolar junction transistors in the core were analyzed. On top of the EMC susceptibility comparison, basic parameters like temperature drift, sensitivity to an operational amplifier input offset and line regulation are also discussed. The influence of a collector leakage current compensation at high temperatures is investigated as well.en
dc.formattextcs
dc.format.extent413-421cs
dc.format.mimetypeapplication/pdfen
dc.identifier.citationRadioengineering. 2022 vol. 31, č. 3, s. 413-421. ISSN 1210-2512cs
dc.identifier.doi10.13164/re.2022.0413en
dc.identifier.issn1210-2512
dc.identifier.urihttp://hdl.handle.net/11012/208233
dc.language.isoencs
dc.publisherSpolečnost pro radioelektronické inženýrstvícs
dc.relation.ispartofRadioengineeringcs
dc.relation.urihttps://www.radioeng.cz/fulltexts/2022/22_03_0413_0421.pdfcs
dc.rightsCreative Commons Attribution 4.0 International licenseen
dc.rights.accessopenAccessen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectBandgap voltage referenceen
dc.subjectBrokawen
dc.subjectBCDen
dc.subjectEMCen
dc.subjectHF immunityen
dc.subjectKuijken
dc.subjectoffseten
dc.subjecttemperature driften
dc.subjectTsividisen
dc.titleAn EMC Susceptibility Study of Integrated Basic Bandgap Voltage Reference Coresen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
eprints.affiliatedInstitution.facultyFakulta eletrotechniky a komunikačních technologiícs
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