Comparing Main Spectroscopic Da
but.event.date | 26.04.2018 | cs |
but.event.title | Student EEICT 2018 | cs |
dc.contributor.author | Pokorny, Josef | |
dc.date.accessioned | 2019-03-04T10:05:56Z | |
dc.date.available | 2019-03-04T10:05:56Z | |
dc.date.issued | 2018 | cs |
dc.description.abstract | This article deals with comparing of data in the main world spectroscopic databases NIST and Kurucz. Our target was to calculate differences in the ratio of Stark broadening and function F which depends on electron density, temperature and pressure. Stark broadening is one of pressure broadenings of spectral lines which arise from the collisions of the emitters with neighboring particles. Stark broadening is due to charged perturbers. We developed the program NKrov for the comparison of databases with the help of regular expressions and the program awk. There were some differences found in input data for the silicon between NIST and Kurucz databases. Our results can be used in further research on silicon spectral lines. | en |
dc.format | text | cs |
dc.format.extent | 493-497 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Proceedings of the 24th Conference STUDENT EEICT 2018. s. 493-497. ISBN 978-80-214-5614-3 | cs |
dc.identifier.isbn | 978-80-214-5614-3 | |
dc.identifier.uri | http://hdl.handle.net/11012/138283 | |
dc.language.iso | en | cs |
dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.relation.ispartof | Proceedings of the 24th Conference STUDENT EEICT 2018 | en |
dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.rights.access | openAccess | en |
dc.subject | Stark broadening | en |
dc.subject | NIST database | en |
dc.subject | Kurucz database | en |
dc.subject | unit system | en |
dc.subject | regular expressions | en |
dc.title | Comparing Main Spectroscopic Da | en |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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