Registration of Partially Focused Images for 2D and 3D Reconstruction of Oversized Samples

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dc.contributor.authorMartišek, Daliborcs
dc.contributor.authorDruckmüllerová, Hanacs
dc.coverage.issue4cs
dc.coverage.volume2017cs
dc.date.accessioned2020-08-04T11:03:10Z
dc.date.available2020-08-04T11:03:10Z
dc.date.issued2017-12-18cs
dc.description.abstractMethods of fracture surface 3D reconstruction from a series of partially focused images acquired in a small field of view (e.g., by confocal microscope or CCD camera) are well known. In this case, projection rays can be considered parallel and recorded images do not differ in any geometrical transformation from each other. In the case of larger samples (oversized for microscope or CCD camera), it is necessary to use a wider viewing field (e.g., standard cameras); taken images primarily differ in scaling but may also differ in shifting and rotation.These images cannot be used for reconstruction directly; they must be registered; that is, we must determine all transformations in which the images differ and eliminate their effects.There are several ways to do this. This paper deals with the registration based on phase correlation.en
dc.formattextcs
dc.format.extent1-8cs
dc.format.mimetypeapplication/pdfcs
dc.identifier.citationSCANNING. 2017, vol. 2017, issue 4, p. 1-8.en
dc.identifier.doi10.1155/2017/8538215cs
dc.identifier.issn1932-8745cs
dc.identifier.other147477cs
dc.identifier.urihttp://hdl.handle.net/11012/193255
dc.language.isoencs
dc.publisherHindawics
dc.relation.ispartofSCANNINGcs
dc.relation.urihttps://doi.org/10.1155/2017/8538215cs
dc.rightsCreative Commons Attribution 4.0 Internationalcs
dc.rights.accessopenAccesscs
dc.rights.sherpahttp://www.sherpa.ac.uk/romeo/issn/1932-8745/cs
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/cs
dc.subject2D reconstructionen
dc.subject3D Reconstructionen
dc.subjectPhase Coorrelationen
dc.subjectconfocal microscopeen
dc.subjectclassical cameraen
dc.titleRegistration of Partially Focused Images for 2D and 3D Reconstruction of Oversized Samplesen
dc.type.driverarticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen
sync.item.dbidVAV-147477en
sync.item.dbtypeVAVen
sync.item.insts2021.02.26 12:53:02en
sync.item.modts2021.02.26 12:13:55en
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Ústav matematikycs
thesis.grantorVysoké učení technické v Brně. Fakulta strojního inženýrství. Sekce matematikycs
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