Dark J–V Characteristics Model Of Chalcopyrite-Based Solar Cells
but.event.date | 26.04.2018 | cs |
but.event.title | Student EEICT 2018 | cs |
dc.contributor.author | Škvarenina, L’ubomír | |
dc.date.accessioned | 2019-03-04T10:05:58Z | |
dc.date.available | 2019-03-04T10:05:58Z | |
dc.date.issued | 2018 | cs |
dc.description.abstract | An equivalent circuit model of the current parasitic pathways is proposed to describe a behaviour of dark current density–voltage characteristics of chalcopyrite-based solar cells in order to understand a shunting behaviour between the ZnO:Al/i-ZnO/CdS/Cu(In;Ga)Se2/MoSe2/Mo/Ti/TiN layers. The model fitting with a parameter extraction is evaluated for the sample before and after an appearance of a permanent breakdown to prove an accurate response of the proposed model to an ohmic and non-ohmic component shift. | en |
dc.format | text | cs |
dc.format.extent | 528-532 | cs |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Proceedings of the 24th Conference STUDENT EEICT 2018. s. 528-532. ISBN 978-80-214-5614-3 | cs |
dc.identifier.isbn | 978-80-214-5614-3 | |
dc.identifier.uri | http://hdl.handle.net/11012/138290 | |
dc.language.iso | en | cs |
dc.publisher | Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.relation.ispartof | Proceedings of the 24th Conference STUDENT EEICT 2018 | en |
dc.relation.uri | http://www.feec.vutbr.cz/EEICT/ | cs |
dc.rights | © Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií | cs |
dc.rights.access | openAccess | en |
dc.subject | dark J–V characteristics | en |
dc.subject | parasitic current pathways | en |
dc.subject | heterojunction | en |
dc.subject | CIGS | en |
dc.subject | solar cell | en |
dc.subject | thin-film | en |
dc.subject | equivalent electrical model | en |
dc.subject | parameters extraction | en |
dc.title | Dark J–V Characteristics Model Of Chalcopyrite-Based Solar Cells | en |
dc.type.driver | conferenceObject | en |
dc.type.status | Peer-reviewed | en |
dc.type.version | publishedVersion | en |
eprints.affiliatedInstitution.department | Fakulta elektrotechniky a komunikačních technologií | cs |
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